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บทที่ 2 Semiconductor and P-N junction
EEE270 Electronic engineering
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Semiconductor material
Silicon wafer EEE270 Electronic engineering
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Semiconductor material
Silicon crystal Sand 25% silicon EEE270 Electronic engineering
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Semiconductor material
EEE270 Electronic engineering
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EEE270 Electronic engineering
Silicon atom EEE270 Electronic engineering
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Intrinsic semiconductor
Silicon Crystal at T= 0 °K EEE270 Electronic engineering
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EEE270 Electronic engineering
Energy gap EEE270 Electronic engineering
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EEE270 Electronic engineering
Energy level An electron-volt is the energy of an electron that has been accelerated through a potential difference of 1 volt, and 1eV= 1.6*10-19 joules EEE270 Electronic engineering
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Intrinsic semiconductor
Silicon Crystal at T > 0 °K EEE270 Electronic engineering
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The Intrinsic Carrier Concentration
ni is the intrinsic carrier concentration B is a constant related to the specific semiconductor material Eg is the band-gap energy (eV) T is the temperature (°K) k is Boltzmann’s constant (86 x 10-6eV/°K) EEE270 Electronic engineering
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Electrical current EEE270 Electronic engineering
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Doping and Extrinsic Semiconductors
EEE270 Electronic engineering
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Basic silicon doping ขั้นตอนในการแพร่สารเจือเบื้องต้น
หลักการแพร่กระจายของหมึกในนํ้า แสดงการแพร่สารเจือ (Diffusion) เกิดเป็นรอยต่อ P-N EEE270 Electronic engineering
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Type of doping process เตาแพร่สารเจือที่มีแหล่งจ่ายเป็นของแข็ง
เตาแพร่สารเจือที่มีแหล่งจ่ายเป็นของเหลว เตาแพร่สารเจือที่มีแหล่งจ่ายเป็นแก๊ส การโดปโดยใช้วิธียิงอิออน (Ion-Implantation) EEE270 Electronic engineering
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N-type semiconductor EEE270 Electronic engineering
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EEE270 Electronic engineering
P-type semiconductor EEE270 Electronic engineering
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Thermal equilibrium no = thermal equilibrium concentration of free electron po = thermal equilibrium concentration of hole Silicon Crystal at T > 0 °K EEE270 Electronic engineering
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Thermal equilibrium (N-type)
EEE270 Electronic engineering
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Thermal equilibrium (P-type)
EEE270 Electronic engineering
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Drift and Diffusion Currents
EEE270 Electronic engineering
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Drift and Diffusion Currents
EEE270 Electronic engineering
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Drift and Diffusion Currents
EEE270 Electronic engineering
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Drift and Diffusion Currents
EEE270 Electronic engineering
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Drift and Diffusion Currents
EEE270 Electronic engineering
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Drift and Diffusion Currents
EEE270 Electronic engineering
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Drift and Diffusion Currents
EEE270 Electronic engineering
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Drift and Diffusion Currents
EEE270 Electronic engineering
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P-N junction Bell Labs the first transistor in December 1947.
EEE270 Electronic engineering
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P-N Junction EEE270 Electronic engineering
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The Equilibrium P-N Junction
EEE270 Electronic engineering
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The Equilibrium P-N Junction
Barrier potential or Built-in voltage is called thermal voltage, approximately 0.026V at room temperature, T=300 °K EEE270 Electronic engineering
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Built-in voltage EEE270 Electronic engineering
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P-N Junction biasing Forward-bias Non-bias Reward-bias
EEE270 Electronic engineering
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P-N Junction biasing EEE270 Electronic engineering
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Junction capacitance EEE270 Electronic engineering
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Reverse-Biased P-N Junction
Reward-bias Cj : Junction Capacitance Cj0 : Junction Capacitance at zero applied voltage VR : Reverse bias voltage Vbi : built-in voltage EEE270 Electronic engineering
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Forward-Biased P-N Junction
IS : Reverse-bias Saturation current, in the range of to 10-13 VT : Thermal voltage n : emission coefficient or ideality factor, in the range 1 n 2 EEE270 Electronic engineering
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Forward-Biased P-N Junction
EEE270 Electronic engineering
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